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 EL (Electro Luminescence) Micro-Crack Inspection System for PV-Cells
PV-Cell Visual Inspection System
  • Glare cancel technology enables poly-crystal wafer inspection.
  • Printed patterns, cracks, voids, detentions can be inspected.
  • Can be incorporated into the production line.
  • High resolution 2D or 3D sensor is selected by application.
  • Custom made software by Hu-Brain is available.
  • The entire system is made in Hu-Brain’s Japanese factory. Custom equipment available on request.
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